A Model-oriented Methodology for the Automatic Parameter Extraction of TFT Model
M.H. Fino (Univ. Nova de Lisboa, Portugal), P. Barquinha (Nova School of Science and Techn., Portugal)
The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.
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