Parameter Identification for Behavioral Modeling of Analog Components Including Degradation

M. Taddiken, T. Hillebrand, K. Tscherkaschin, S. Paul, D. Peters-Drolshagen (Univ. Bremen, Germany)

An analog system's performance can be influenced by many factors such as age-dependent degradation effects which need to be considered during the design process. Transistor level degradation analysis is very time-consuming for large and complex circuits. Behavioral models can be used to speed up the simulation and enable an evaluation on a higher abstraction level. In this paper, a structured method for the development of behavioral models is proposed. By using Response Surface Models to represent a system's key-performances, reliability analysis on system level is possible. A sensitivity analysis is used to identify the relevant parameters and to reduce the overall complexity of the model. The method is demonstrated on an amplifier and a voltage reference.