Conference paper

Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits

G. Wirth (Univ. Federal do Rio Grande do Sul, Brazil)

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Download one page abstract

Receipt of papers:

March 15th, 2021

Notification of acceptance:

May 11th, 2021

Registration opening:

May 17th, 2021

Final paper versions:

May 31th, 2021