Conference paper

Estimating and Improving IC Manufacturing Yield. Past, Present and Future

W. Kuźmicz (Warsaw Univ. of Techn., Poland)

IC manufacturing yield has been the crucial technical and economical issue since the beginning of the microelectronic industry. This presentation gives an overview of the methods and tools helping to estimate and improve yield, including current challenging problems.

Download one page abstract

Receipt of papers:

March 15th, 2022

Notification of acceptance:

April 30th, 2022

Registration opening:

May 12th, 2022

Final paper versions:

May 20th, 2022