A Flexible CMOS Test-Pixel Readout System

D. Sami (Photolitics OOD and Univ. of Ruse, Bulgaria), D. Levski (Photolitics OOD, Bulgaria), G. Meynants (Photolitics OOD, Bulgaria and KU Leuven, Belgium), M. Waeny, N. Dimitrov, G. Bochev (Photolitics OOD, Bulgaria), R. Kandilarov (Photolitics OOD and Univ. of Ruse, Bulgaria)

A readout system designed for characterizing CMOS active pixels for imaging with global or rolling shutter operation is presented. The readout chain consists of an analog and digital column-parallel front end to increase readout speed. The column readout circuitry shown in detail includes a Programmable Gain Amplifier (PGA) with Correlated Double Sampling (CDS) and offset cancelling features. Programmable row and global drivers which improve the system flexibility have been discussed. The presented readout design was silicon proven on a 0.11um Front Side Illumination CMOS process in reading out 7T charge domain pixels with single-snapshot High-Dynamic Range (HDR) features.