Recording Channel Parameters Influence Analysis on Time-Related X-ray Based Measurements in CMOS 40 nm

F. Księżyc, P. Kmon (AGH Univ. of Krakow, Poland)

This paper describes the analysis of the influence of typical detector readout electronics front-end parameters on time-related X-ray based measurements Here two types of recordings are considered, i.e. the Time over Threshold (ToT) and Time of Arrival (ToA) used for energy and incoming particle arrival time measurements respectively. The proposed CSA circuit includes the core amplifier based on a folded cascode amplifier circuit with source follower output and the feedback circuit based on the constant current circuit architecture designed in the TSMC 40nm process that allowed us to acquire less than 10ns edge rise time and ENC less than 120 e- for amplifier biasing current in range of 3µA to 20µA. This work aims to show how time measurement detector readout circuit precision depends on front-end electronics, which could improve future design works and shows limitations that could not be avoided in this approach.