Conference paper

Investigations Properties of Selected Methods of Measurements of Thermal Parameters of the IGBT

K. Górecki, P. Górecki (Gdynia Maritime Univ., Poland)

In this paper usefulness of electric and optical measurement methods to determine reliably values of thermal parameters of the IGBT is analysed. Factors influencing a measuring error of the considered methods are discussed. The results of measurements of the considered parameters obtained with the use of the considered methods for different cooling conditions of the tested transistor are presented and discussed. It is shown, in what operating conditions each measuring method makes it possible to obtain reliable results.

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Receipt of papers:

March 13th, 2020

Notification of acceptance:

May 18th, 2020

Registration opening:

May 20th, 2020

Final paper versions:

June 5th, 2020